C|DI has developed a revolutionary new class of AFM probes, with carbon nanotube (CNT) tips, that enable unprecedented levels of imaging clarity and precision measurement for research and industrial applications. They offer AFM users the next real advancement for AFM operation.
CCHAR • 1.0µm Total CNT |
CCHR • <500nm Total CNT |
CNT AFM probes from C|D|I are made using a patent pending process for the deterministic production of CNT devices. This process allows C|D|I to predictably produce CNT AFM probes with specified properties such as angle and length. In addition, the CNT is securely mounted to the probe with the tip angle normal to the surface operating in compression regime of the CNT.
These durable, multi-wall probes offer superior value through longer lifetime and provide the length and sharpness to clearly explore and image hard to resolve surfaces.
AFM tip performance, reliability and sharpness are key to overall system performance – CNT probes from C|D|I can help you to produce simply, better images.
Compatible with all major AFM systems
C|D|I probes are made to be completely compatible with all major AFM systems. For this reason, CNT AFM Probes from C|D|I allow users to improve their results on any platform – without making an investment in new capital equipment. C|D|I probes allow for improved total cost of ownership because they are stronger and longer lived, eliminating the need for frequent probe changes that interrupt productivity.
C|D|I CNT AFM Probe Advantage
With CNT AFM probes from C|D|I, users can get more accurate results, clearer images, and better measurements to help them to advance their research.
- Stronger probes offer longer lifetime and reduced cost
- Consistent manufacturing process means changing probes won’t change your results
- Compatible with all major AFM platforms giving you improved results without investing in a new system
- CNT Probes offer opportunities to explore new application areas
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