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FN SERIES

Durable, high aspect ratio, high-quality general purpose CNT tip.

FN-S CNT AFM probe side view

FN

The CDI FN combines high resolution with a high aspect ratio and industry-leading wear resistance. Due to the strength of the carbon nanotube material these probes can withstand more force than Silicon probes without degrading image quality; making them perfect for the expert and novice alike. On average these probes start with higher resolution than other "enhanced resolution" options and retain that image quality for more than 10X the lifetime of the competition producing quality results image after image.

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The tip structure is comprised of a true carbon nanotube. It is an inherently high aspect ratio tip shape allowing for even data accuracy and long lifetime. This combination of high resolution, high aspect ratio, extreme wear durability, high throughput and reliability at an economical price stands alone in the industry.

Regular FN CNT AFM probe

FN

Tip Specifications

Parameter                    Nominal Value

Material                             Carbon

Shape                                  Post

Effective Length              > 100nm

Tilt Compensation                12°

Diameter                         15 - 25nm

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Cantilever Specifications

Parameter                    Nominal Value

Spring Constant (N/m)           3

Frequency (kHz)                    60

Length (µm)                          225

Width (µm)                             45

Thickness (µm)                      2.5

FN SHARP

The CDI FN-S combines "super" resolution with a high aspect ratio and industry-leading wear resistance.

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The tip structure is comprised of a true carbon nanotube. It is an inherently high aspect ratio tip shape. The FN-S has been fabricated with a purpose-built taper to the probe structure. It is still very high aspect ratio (>10:1) and very High Resolution allowing for even greater data accuracy.

FN-S CNT AFM probe

FN-S

Tip Specifications

Parameter                    Nominal Value

Material                             Carbon

Shape                                  Post

Effective Length              > 100nm

Tilt Compensation                12°

Diameter                         15 - 25nm

Radius of Curvature          < 5nm

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Cantilever Specifications

Parameter                    Nominal Value

Spring Constant (N/m)           3

Frequency (kHz)                    60

Length (µm)                          225

Width (µm)                             45

Thickness (µm)                      2.5

FN LONG

The CDI FN-L combines high resolution with the highest aspect ratio and industry-leading wear resistance. Due to the strength of the carbon nanotube material these probes can be much longer and thinner without degrading image quality.

FN-L CNT AFM probe

FN-L

Tip Specifications

Parameter                    Nominal Value

Material                             Carbon

Shape                                  Post

Effective Length              > 500nm

Tilt Compensation                12°

Diameter                         15 - 25nm

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Cantilever Specifications

Parameter                    Nominal Value

Spring Constant (N/m)           3

Frequency (kHz)                    60

Length (µm)                          225

Width (µm)                             45

Thickness (µm)                      2.5

For a quote or business inquires, contact us.

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